In photonic integrated circuit (PIC) design, much of the focus is on designing manufacturable circuits, achieved through the use of process design kits (PDKs). However, an equally important aspect that is often overlooked is ensuring that the PICs we design are also testable.
Our Product Marketing and Technical Sales Manager, Chiara Alessandri, contributed to the September issue of Photonics Spectra with an informative article titled "Test Design Kits Accelerate a Fab-less to Lab-less Transition". In this article, Chiara dives into the importance of considering test requirements early in the design process and how test providers and design software, like the Luceda Photonics Design Platform, can simplify "design for test" for PIC designers through the development of Test Design Kits (TDK).
Here are some key takeaways from the article:
- Testing as a Service: Testing PICs is complex, requiring specific equipment, calibration expertise, and design understanding, which limits many organizations from developing in-house testing capabilities. The trend of testing as a service is gaining traction, allowing companies and research institutions to access advanced testing capabilities without the need for significant investment in equipment. However, challenges persist, especially when designs are not optimized for testing and are too difficult to measure with standard equipment configurations. This forces them to create custom test setups, which leads to lower yields, higher costs, and increased time investments. Early collaboration between design and test engineers is crucial to streamline the testing process and reduce inefficiencies.
- Design for Test (DfT): The concept of DfT plays a crucial role in standardizing the testing process for PICs. Proper placement of optical and electrical I/Os on the chip, ensuring compatibility with test equipment and methodologies, is essential for enabling downstream engineers to efficiently test the designed circuits. A well-organized test protocol enhances the likelihood of a smooth transition from the design phase to the testing stage. DfT focuses on incorporating test requirements during the design phase, enabling easier testing later. This means that designers create their circuits while considering test requirements and restrictions right from the outset.
- Role of Test Design Kits (TDKs): TDKs streamline the Design for Test (DfT) process by providing clear layout guidelines and automating rule checks. Using TDKs, designers can make better-informed design choices that minimize the risk of testing errors and the need for costly custom solutions. This means that TDKs serve as a bridge between design requirements and testing constraints, ensuring that designs are optimized for compatibility with testing methodologies from the outset, enhancing overall efficiency.
- Future of TDKs in the Industry: By integrating testing into the design process and emphasizing the importance of early testing considerations, TDKs play a vital role in addressing industry challenges and facilitating the ongoing growth of photonic technologies. The broad adoption of TDKs is expected to enhance the efficiency, reliability, and competitiveness of the integrated photonics industry, especially as demand for advanced designs increases.
At Luceda Photonics, we offer designers powerful PIC design and simulation tools to seamlessly transition from the design phase to manufacturable and testable photonic integrated circuits. Our advanced solutions, including the TDKs discussed in the article, are key to making the development process more efficient and cost-effective. With the Luceda Photonics Design Platform, designers can create PICs that are ready to be manufactured, assembled, and/or tested. With the Luceda Design Kits, we help close the gap between concept and product by giving PIC designers the means to test and validate their designs early in the process, in alignment with foundry-specific requirements, reducing time to market.
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