Webinar | From Wafer Measurements to Insights: Analyzing Cornerstone Silicon Photonics Data with Nexus

With the increasing complexity of photonic device development, the ability to efficiently manage, analyze, and extract insights from large volumes of measurement data has become more important than ever. A lack of standardized infrastructure forces engineering teams to rely on fragmented tool chains and often causes them to lose months due to slow validation, undetected process drifts, and costly silicon-to-model mismatches. As fabrication platforms generate growing amounts of test data, engineering teams need robust tools to transform fragmented datasets into actionable insights that accelerate innovation and improve design outcomes.

Join us for a webinar with Luceda Photonics and CORNERSTONE, an open-source, license-free silicon photonics rapid-prototyping foundry offering technology platforms for applications including telecommunications, sensing, LiDAR, and quantum technologies. Together, we will explore how a powerful photonic data infrastructure can unlock the full value of measurement data generated through these platforms.

In this session, we will introduce Luceda’s new product line, Nexus, and how it enables teams to unlock the full value of measurement data. Using a real-world CORNERSTONE silicon photonics dataset, we will show how Nexus Data Hive and Nexus Data Explorer seamlessly manage, structure, analyze, and visualize measurement data, providing deeper insights into device performance and manufacturing processes.

In this webinar, you will learn:

• The challenges of managing large-scale photonic measurement datasets and how structured data pipelines address them.
• How Nexus Data Hive organizes and transforms fragmented measurement data into a centralized, analysis-ready database.
• How Nexus Data Explorer enables advanced visualization, statistical analysis, and engineering insight generation.
• How open-access silicon photonics measurement data from Cornerstone is analyzed using Nexus.
• How open-access fabrication platforms and publicly available datasets can accelerate photonics innovation.
• Practical workflows for turning wafer measurement data into actionable engineering insights.

Whether you are developing photonic integrated circuits, managing raw measurement data, or looking to improve your data-driven engineering processes, this webinar will provide practical insights into powerful photonic data management and analytics.

Register now to discover how to transform photonic measurement data into actionable insights, streamline engineering workflows, and accelerate the path from wafer measurements to innovation.