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DTSTART:20001029T030000
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BEGIN:VEVENT
UID:20260525T122305Z - 61824@eupp208
DTSTART;TZID=Europe/Brussels:20260130T140000
DTEND;TZID=Europe/Brussels:20260130T144500
CREATED:20260525T122305Z
DESCRIPTION:<a href="https://www.lucedaphotonics.com/event/when-heat-interf
 eres-a-data-driven-workflow-to-analyze-thermal-crosstalk-in-pic-switch-net
 works-167/register">When heat interferes: A data-driven workflow to analyz
 e thermal crosstalk in PIC switch networks</a>\nSpeaker Missed the webinar
 ? Watch Now To meet the escalating bandwidth requirements of AI clusters a
 nd data center interconnects\, the industry is rapidly pivoting towards ad
 vanced optical communication solutions. By bringing the electro-optic inte
 rface closer to electronic chips that process the data\, and enabling high
 -speed communication with a low cost per bit\, PICs have become one of the
  key enablers of next-generation computing architectures. At the heart of 
 these systems are complex optical switching networks\, which are used to r
 edirect light signals from one destination to another. These networks ofte
 n rely on active components\, such as MZI switches\, to steer light betwee
 n outputs. While this approach offers flexibility and scalability\, real-w
 orld implementations face a challenging tradeoff between limited chip area
 \, accumulated optical losses\, and crosstalk between the channels. Nirav 
 Annavarapu\, PhD Application Engineer at Luceda Photonics Although losses 
 and crosstalk are often estimated using simple frequency-domain simulation
 s\, the impact of the spatial heat distribution is difficult to calculate.
  It can ultimately dictate key architectural and layout decisions and sign
 ificantly impact device performance. In this webinar\, we’ll show you ho
 w to estimate the impact of parasitic thermal effect by using Layout-Aware
  Variability Analysis in Luceda Circuit Analyzer. You will learn how to: D
 esign and leverage parametric circuits in Luceda IPKISSSet up and run layo
 ut-aware variability analysis simulationsLeverage Luceda’s data-driven w
 orkflows to efficiently perform such analysesPerform tradeoff analyses usi
 ng Circuit Analyzer to guide robust design decisions Join us to gain pract
 ical insights into thermal crosstalk analysis and learn how Luceda Photoni
 cs can help you design more scalable\, reliable photonic switch networks b
 efore committing to fabrication. [...]
DTSTAMP:20260525T122305Z
LOCATION:Online event
SUMMARY:When heat interferes: A data-driven workflow to analyze thermal cro
 sstalk in PIC switch networks
X-ALT-DESC;FMTTYPE=text/html:<a href="https://www.lucedaphotonics.com/event
 /when-heat-interferes-a-data-driven-workflow-to-analyze-thermal-crosstalk-
 in-pic-switch-networks-167/register">When heat interferes: A data-driven w
 orkflow to analyze thermal crosstalk in PIC switch networks</a>\nSpeaker M
 issed the webinar? Watch Now To meet the escalating bandwidth requirements
  of AI clusters and data center interconnects\, the industry is rapidly pi
 voting towards advanced optical communication solutions. By bringing the e
 lectro-optic interface closer to electronic chips that process the data\, 
 and enabling high-speed communication with a low cost per bit\, PICs have 
 become one of the key enablers of next-generation computing architectures.
  At the heart of these systems are complex optical switching networks\, wh
 ich are used to redirect light signals from one destination to another. Th
 ese networks often rely on active components\, such as MZI switches\, to s
 teer light between outputs. While this approach offers flexibility and sca
 lability\, real-world implementations face a challenging tradeoff between 
 limited chip area\, accumulated optical losses\, and crosstalk between the
  channels. Nirav Annavarapu\, PhD Application Engineer at Luceda Photonics
  Although losses and crosstalk are often estimated using simple frequency-
 domain simulations\, the impact of the spatial heat distribution is diffic
 ult to calculate. It can ultimately dictate key architectural and layout d
 ecisions and significantly impact device performance. In this webinar\, we
 ’ll show you how to estimate the impact of parasitic thermal effect by u
 sing Layout-Aware Variability Analysis in Luceda Circuit Analyzer. You wil
 l learn how to: Design and leverage parametric circuits in Luceda IPKISSSe
 t up and run layout-aware variability analysis simulationsLeverage Luceda
 ’s data-driven workflows to efficiently perform such analysesPerform tra
 deoff analyses using Circuit Analyzer to guide robust design decisions Joi
 n us to gain practical insights into thermal crosstalk analysis and learn 
 how Luceda Photonics can help you design more scalable\, reliable photonic
  switch networks before committing to fabrication. [...]
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