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BEGIN:VEVENT
UID:20260524T123836Z - 78764@eupp208
DTSTART;TZID=Europe/Brussels:20250605T160000
DTEND;TZID=Europe/Brussels:20250605T170000
CREATED:20260524T123836Z
DESCRIPTION:<a href="https://www.lucedaphotonics.com/event/design-for-testi
 ng-in-photonics-153/register">Design for Testing in Photonics</a>\nSpeaker
 s Miquel Minguillon Application Engineer at VLC Photonics Craig Godbold Ap
 plication Engineer at Luceda Photonics Moderator Aysan Anamoradi Applicati
 on Engineer at Luceda Photonics Missed the webinar? Watch Now The concept 
 of “design for testing” is key to standardizing the testing process fo
 r PICs. In essence\, it involves designers factoring in test requirements 
 and restrictions from the very beginning of the PIC design process. Howeve
 r\, putting this concept into practice can be challenging. Aligning the re
 quirements of foundries with those of testing partners often introduces po
 tential pitfalls. Join us for a webinar where Luceda Photonics and VLC Pho
 tonics will showcase how the understanding of “design for test” and Te
 st Design Kits (TDKs) can support PIC designers in preparing their layouts
  for standardized\, automated testing — reducing risks\, shortening deve
 lopment cycles\, and lowering costs. Luceda Photonics will discuss the ena
 blement of a streamlined design-for-test workflow through its platform\, h
 elping PIC designers incorporate testability from the start. By supporting
  Test Design Kits (TDKs)\, the Luceda platform allows designers to work wi
 th test-specific building blocks\, apply layout rules\, and ensure their c
 ircuits are ready for efficient\, standardized testing. This approach help
 s align designs with the requirements of test partners and reduces the ris
 k of costly design iterations later in the process. VLC Photonics will the
 n present their outsourced photonic design and test services and explain t
 he importance of layout rules for successful testing. They will share thei
 r experience as a test house implementing Luceda TDKs for their characteri
 zation activities and demonstrate how this approach accelerates the design
  iterations from fabrication to measurement. By the end of this session\, 
 you'll have a thorough understanding of how to design PICs [...]
DTSTAMP:20260524T123836Z
LOCATION:Online event
SUMMARY:Design for Testing in Photonics
X-ALT-DESC;FMTTYPE=text/html:<a href="https://www.lucedaphotonics.com/event
 /design-for-testing-in-photonics-153/register">Design for Testing in Photo
 nics</a>\nSpeakers Miquel Minguillon Application Engineer at VLC Photonics
  Craig Godbold Application Engineer at Luceda Photonics Moderator Aysan An
 amoradi Application Engineer at Luceda Photonics Missed the webinar? Watch
  Now The concept of “design for testing” is key to standardizing the t
 esting process for PICs. In essence\, it involves designers factoring in t
 est requirements and restrictions from the very beginning of the PIC desig
 n process. However\, putting this concept into practice can be challenging
 . Aligning the requirements of foundries with those of testing partners of
 ten introduces potential pitfalls. Join us for a webinar where Luceda Phot
 onics and VLC Photonics will showcase how the understanding of “design f
 or test” and Test Design Kits (TDKs) can support PIC designers in prepar
 ing their layouts for standardized\, automated testing — reducing risks\
 , shortening development cycles\, and lowering costs. Luceda Photonics wil
 l discuss the enablement of a streamlined design-for-test workflow through
  its platform\, helping PIC designers incorporate testability from the sta
 rt. By supporting Test Design Kits (TDKs)\, the Luceda platform allows des
 igners to work with test-specific building blocks\, apply layout rules\, a
 nd ensure their circuits are ready for efficient\, standardized testing. T
 his approach helps align designs with the requirements of test partners an
 d reduces the risk of costly design iterations later in the process. VLC P
 hotonics will then present their outsourced photonic design and test servi
 ces and explain the importance of layout rules for successful testing. The
 y will share their experience as a test house implementing Luceda TDKs for
  their characterization activities and demonstrate how this approach accel
 erates the design iterations from fabrication to measurement. By the end o
 f this session\, you'll have a thorough understanding of how to design PIC
 s [...]
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