29-31 August 2018 / Cancun Mexico
IPKISS was used to predict the yield of filter circuits in the presence of fabrication variations based on spatially correlated maps of linewidth and thickness.
The article illustrates how IPKISS can enable mature organizations to take a big leap forward and create a design flow that is more reliable and scalable.
Wim Bogaerts, Umar Khan and Yufei Xing
Ghent University - imec, Photonic Research Group, Department of Information Technology, Gent, Belgium.
Center of Nano and Biophotonics, Ghent University, Belgium.
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